Biography
Felipe Rivera joined Brigham Young University as the Director of the Electron Microscopy Facility in November 2020. Prior to this position, he worked over eight years as a Process Development Engineer at Intel Corporation, where he used advanced electron microscopy techniques to provide characterization, yield, and failure analysis for the 14 nm, 10 nm, Intel7, Intel4, and other subsequent microchip manufacturing process nodes.
His current work continues to focus on the application of advanced electron microscopy techniques for the imaging and characterization of materials and devices at the micro- and nanoscale.
Felipe Rivera received doctoral and master's degrees in Physics from Brigham Young University and a bachelor's degree in Physics from the University of California, Riverside.
Research Interests
Use advanced electron microscopy techniques to provide imaging and characterization of materials and devices at the micro- and nanoscale.Teaching Interests
Electron and Ion Beam MicroscopyEducation
- Ph.D., Physics , Brigham Young University (2012)
- M.S., Physics , Brigham Young University (2010)
- Teaching Credential, , Chapman University (2003)
- B.S., Physics , University of California, Riverside (2000)
Licenses and Certifications
- California Commission on Teacher Credentialing, California Teaching Credential (2003 - 2028)
Administrative Assignments
- Electron Microscopy Facility: Director (2020 - Present)