Tecnai F30 TEM

Tecnai F30 TEM
FEI Tecnai F30 TEM

The Tecnai F30 microscope is a reliable and proven transmission electron microscope that offers:
High performance TEM imaging and diffraction pattern acquisition
High spatial coherence due to an ultra-stable FEI Schottky source
State-of-the-art, superior stability, high-tension circuitry resulting in an energy spread of less than 0.8 eV
Computerized stage with unique eucentric specification for
- the highest resolution tomography capabilities
- maximized tilts
- maximum stability
You can see more specifications of the system below
Tecnai F30 TEM
Specifications 

 

 

  • Schottky Field emitter with high maximum beam current (> 100 nA) 
  • High probe current (> 0.6 nA in a 1 nm spot, > 15 nA in a 10 nm spot) 
  •  Small energy spread (0.8 eV or less) 
  •  Spot drift < 1 nm/minute
  • TEM point resolution: 0.24 nm
  • TEM line resolution: 0.144 nm
  • Minimum focus step: 3 nm
  • Magnification range: 60x – 800kx
  • Diffraction angle: 20˚
  • Maximum tilt: ± 70˚
  • Accelerating voltage range of 200 to 300 kV
  • Available specimen holders: Single tilt, Single tilt Tomography, Double-tilt, Double-tilt cooling, Double-tilt heating
  •  Fully computer-controlled, eucentric side-entry, high stability CompuStage 
  •  X, Y movement 2 mm, specimen size 3 mm 
  • Specimen recall reproducibility ≤ 0.1 μm (x, y) and ≤ 0.1° (α tilt) attainable 
  • Stage Drift < 0.5 nm/minute with a standard holder