FEI Tecnai F20 TEM/STEM
The Tecnai G2 F20 microscope is a high performance 200kV scanning transmission electron microscope that offers:
The patented U-TWIN objective lens enables high performance S/TEM imaging with sub nanometer spatial resolution
High spatial coherence and high brightness due to an ultra-stable FEI Schottky source
State-of-the-art, superior stability, high-tension circuitry resulting in an energy spread of less than 0.7 eV
Computerized stage with unique eucentric specification for maximum stability
Accessories include:
Slow-scan CCD cameras
High-angle annular dark-field detector (HAADF) for STEM
X-ray energy-dispersive spectrometer (XEDS)
Parallel electron energy-loss spectrometer (PEELS)
In-column Monochromator for energy-filtered imaging (EFTEM)
You can see more specifications of the system below
Specifications
- Schottky Field emitter with high maximum beam current (> 100 nA)
- High probe current (> 0.5 nA in a 1 nm spot, > 15 nA in a 10 nm spot)
- Small energy spread (0.7 eV or less)
- Spot drift < 1 nm/minute
- TEM point resolution: 0.19 nm
- TEM line resolution: 0.102 nm
- Minimum focus step: 0.35 nm
- Magnification range: 25x – 1,000kx
- STEM HAADF resolution: 0.14 nm
- STEM magnification range: 150x – 230Mx
- Diffraction angle: ±16˚
- Maximum tilt: ± 20˚
- Accelerating voltage range of 20 to 200 kV
- Available specimen holders: Low-Background Double-tilt, Double-tilt cooling, Double-tilt heating
- Fully computer-controlled, eucentric side-entry, high stability CompuStage
- X, Y movement 2 mm, specimen size 3 mm
- Specimen recall reproducibility ≤ 0.3 μm (x, y) and ≤ 0.1° (α tilt) attainable
- Stage Drift < 0.5 nm/minute with a standard holder