Tecnai F20 TEM/STEM/AEM


FEI Tecnai F20 TEM/STEM

 

The Tecnai G2 F20 microscope is a high performance 200kV scanning transmission electron microscope that offers:
The patented U-TWIN objective lens enables high performance S/TEM imaging with sub nanometer spatial resolution
High spatial coherence and high brightness due to an ultra-stable FEI Schottky source
State-of-the-art, superior stability, high-tension circuitry resulting in an energy spread of less than 0.7 eV
Computerized stage with unique eucentric specification for maximum stability
Accessories include:
Slow-scan CCD cameras
High-angle annular dark-field detector (HAADF) for STEM
X-ray energy-dispersive spectrometer (XEDS)
Parallel electron energy-loss spectrometer (PEELS)
In-column Monochromator for energy-filtered imaging (EFTEM)
You can see more specifications of the system below

 

Tecnai F20 TEM/STEM/AEM

Specifications 

 

  • Schottky Field emitter with high maximum beam current (> 100 nA) 
  • High probe current (> 0.5 nA in a 1 nm spot, > 15 nA in a 10 nm spot) 
  •  Small energy spread (0.7 eV or less) 
  •  Spot drift < 1 nm/minute
  • TEM point resolution: 0.19 nm
  • TEM line resolution: 0.102 nm
  • Minimum focus step: 0.35 nm
  • Magnification range: 25x – 1,000kx
  • STEM HAADF resolution: 0.14 nm
  • STEM magnification range: 150x – 230Mx
  • Diffraction angle: ±16˚
  • Maximum tilt: ± 20˚
  • Accelerating voltage range of 20 to 200 kV
  • Available specimen holders: Low-Background Double-tilt, Double-tilt cooling, Double-tilt heating
  •  Fully computer-controlled, eucentric side-entry, high stability CompuStage 
  •  X, Y movement 2 mm, specimen size 3 mm 
  • Specimen recall reproducibility ≤ 0.3 μm (x, y) and ≤ 0.1° (α tilt) attainable 
  • Stage Drift < 0.5 nm/minute with a standard holder